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| 公开/私有: | 公开 私有 |
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| 公开/私有: | 公开 私有 |
- 呈贡五层中文图书藏阅区 (26)
- 呈贡一层基藏三区TJ-Z (20)
- (莲华)四楼书库 (7)
- (城市学院)105工业技术外借处 (6)
- 呈贡一层基藏二区K-TH (4)
- (城市学院)6库外刊 (2)
- 呈贡六层中文图书藏阅区 (2)
- (莲华)301外刊室 (2)
- 莲华208 (1)
- 呈贡七层中文图书藏阅区 (1)
- 呈贡三层中文图书藏阅区 (1)
- (莲华)四楼检索刊室 (1)
- (城市学院)7库 (1)
- 城市学院艺术分馆 (1)
馆藏地点
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著者:
sponsored by Electronics test
Circuits manufacturing
and EOS/ESD technology magazines ; endorsed by the American Society of Test Engineers.
出版社:
Miller Freeman Expositions,
出版日期: c1990.
文献类型:
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著者:
sponsored by: Electronics Test
Circuits Manufacturing and EOS/ESD Technology magazines; endorsed by: the American Society of Test Engineers(ASTE).
出版社:
MG expositions Group,Div. of Miller Freeman Publications,
出版日期: 1988.
文献类型:
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著者:
sponsored by: Electronics Test
Circuits Manufacturing
EOS/ESD Technology magazines; endorsed by: the American Society of Test Engineers(ASTE).
出版社:
MG expositions Group,Div. of Miller Freeman Publications,
出版日期: 1988.
文献类型:
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