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	1.		ALChE 66th Annual Meeting,1973 :: / 订购中著者: Philadelphia. 出版社: American Institute of Chemical Engineers, 出版日期: 1973. 文献类型: 图书 , 索书号: TQ-53/1 在馆信息图书信息概览图书目录
	2.		ALChE 66th Annual Meeting,1973 :: / 订购中著者: Philadelphia. 出版社: American Institute of Chemical Engineers, 出版日期: 1973. 文献类型: 图书 , 索书号: TQ-53/1 在馆信息图书信息概览图书目录
	3.		Integration of test with design and manufacturing :: proceedings : International Test Conference, 1987, September 1,2,3, 1987, Sheraton Washington Hotel, Washington, D.C. / 订购中著者: sponsored by the IEEE Computer Society IEEE Philadelphia Section. 出版社: Computer Society Press of the IEEE ; 出版日期: c1987. 文献类型: 图书 , 索书号: 73.865083/I61T 在馆信息图书信息概览图书目录
	4.		Testing's impact on design & technology :: International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986 / 订购中著者: sponsored by the IEEE Computer Society [and] IEEE Philadelphia Section. 出版社: IEEE Computer Society Press, 出版日期: c1986. 文献类型: 图书 , 索书号: 73.865083/I61T 在馆信息图书信息概览图书目录
	5.		The future of test :: International Test Conference, 1985 proceedings, November 19, 20, 21, 1985 / 订购中著者: sponsored by the IEEE Computer Society IEEE Philadelphia Section. 出版社: IEEE Computer Society Press, 出版日期: 1985. 文献类型: 图书 , 索书号: 73.865083/I61T 在馆信息图书信息概览图书目录
	6.		Meeting the tests of time :: International Test Conference 1989 proceedings : August 29-31, 1989 : Sheraton Washington Hotel, Washington, DC / 订购中著者: sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section. 出版社: IEEE Computer Society Press , 出版日期: c1989. 文献类型: 图书 , 索书号: 73.865083/I61T 在馆信息图书信息概览图书目录
	7.		International Test Conference :: proceedings : the three faces of test : design, characterization, production / 订购中著者: sponsored by the IEEE Computer Society Test Technology Committee IEEE Philadelphia Section. 出版社: IEEE Computer Society Pr., 出版日期: c1984. 文献类型: 图书 , 索书号: 73.865083/I61T 在馆信息图书信息概览图书目录
	8.		Discover the new world of test and design :: International Test Conference 1992 proceedings : September 20-24, 1992, Convention Center, Baltimore, MD, USA / 订购中著者: sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section. 出版社: The Conference ; 出版日期: c1992. 文献类型: 图书 , 索书号: TP216-532/I61 在馆信息图书信息概览图书目录
	9.		The changing philosophy of test :: International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC / 订购中著者: sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section. 出版社: IEEE Computer Society Press, 出版日期: 1990. 文献类型: 图书 , 索书号: 73.865083/I61T 在馆信息图书信息概览图书目录
	10.		International Test Conference :: proceedings : the three faces of test : design, characterization, production / 订购中著者: by the IEEE Computer Society Test Technology Committee IEEE Philadelphia Section. 出版社: IEEE Computer Society Pr., 出版日期: c1981. 文献类型: 图书 , 索书号: 73.16083/I59 在馆信息图书信息概览图书目录