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| 公开/私有: | 公开 私有 |
检索词:
Test conference.
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著者:
supported by the IERE
the IQA
the Society of Test Engineers and the Journals TEST and NEW ELECTRONICS.
出版社:
Network,
出版日期: c1981.
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著者:
supported by the IERE
the IQA
the IEE
the Society of Test Engineers and the Journals TEST and NEW ELECTRONICS.
出版社:
Network,
出版日期: 1980.
文献类型:
|